Automated system for extracting and combining tool trace...

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system

Reexamination Certificate

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Details

C703S006000, C703S014000, C703S021000

Reexamination Certificate

active

06968303

ABSTRACT:
A method is provided for configuring a final data set to use for modeling a manufacturing process, the method including requesting a real-time data set from a real-time database, requesting an historical data set from an historical database, and defining a required format for the final data set. The method also includes combining the real-time data set from the real-time database with the historical data set from the historical database using the required format for the final data set.

REFERENCES:
patent: 5621652 (1997-04-01), Eakin
patent: 5719796 (1998-02-01), Chen
patent: 6161213 (2000-12-01), Lofstrom
Shindo et al., “A Study for Designing QC Information System”, Proceedings of the Sixth IEEE/CHMT International Electronic Manufacturing Technology Symposium, Apr. 1989, pp. 356-359.
Lee et al., “IC Performance Prediction for Test Cost Reduction”, Proceedings of 1999 IEEE International Symposium on Semiconductor Manufacturing Conference, Oct. 1999, pp. 111-114.

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