Automated system for designing and testing a probe card

Data processing: financial – business practice – management – or co – Automated electrical financial or business practice or... – Electronic shopping

Reexamination Certificate

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Details

C705S001100, C705S050000, C705S080000, C700S083000, C700S096000, C700S097000, C700S117000, C700S180000, C324S761010

Reexamination Certificate

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07092902

ABSTRACT:
A method and system for designing a probe card from data provided by prospective customers via the Internet is provided. Design specifications are entered into the system by prospective customers and compiled into a database. The collective feasibility of each set of design specifications is determined by an automated computer system and communicated to the prospective customer. If feasible, additional software enables prospective customers to create verification packages according to their respective design specifications. These verification packages further consist of drawing files visually describing the final design and verification files confirming wafer bonding pad data. Verification packages are reviewed and forwarded to an applications engineer after customer approval. An interactive simulation of probe card performance is also provided. Data on probe card performance is incorporated into an overall modeling exercise, which includes not only the probe card, but data on the device(s) under test and wafer, as well as data on automated test equipment.

REFERENCES:
patent: 4873623 (1989-10-01), Lane et al.
patent: 4967381 (1990-10-01), Lane et al.
patent: 5042148 (1991-08-01), Tada et al.
patent: 5065092 (1991-11-01), Sigler
patent: 5539652 (1996-07-01), Tegethoff
patent: 5712858 (1998-01-01), Godiwala et al.
patent: 5801432 (1998-09-01), Rostoker et al.
patent: 5812415 (1998-09-01), Baisuck
patent: 5818249 (1998-10-01), Momohara
patent: 5829128 (1998-11-01), Eldridge et al.
patent: 5864946 (1999-02-01), Eldridge et al.
patent: 5896294 (1999-04-01), Chow et al.
patent: 5900738 (1999-05-01), Khandros et al.
patent: 5917707 (1999-06-01), Khandros et al.
patent: 5974662 (1999-11-01), Eldridge et al.
patent: 5983493 (1999-11-01), Eldridge et al.
patent: 5994152 (1999-11-01), Khandros et al.
patent: 6029344 (2000-02-01), Khandros et al.
patent: 6032356 (2000-03-01), Eldridge et al.
patent: 6042712 (2000-03-01), Mathieu
patent: 6043563 (2000-03-01), Eldridge et al.
patent: 6049895 (2000-04-01), Sugimoto
patent: 6050829 (2000-04-01), Eldridge et al.
patent: 6064213 (2000-05-01), Khandros et al.
patent: 6090261 (2000-07-01), Mathieu
patent: 6113646 (2000-09-01), Holden
patent: 6115835 (2000-09-01), Nevill et al.
patent: 6139177 (2000-10-01), Venkatraman et al.
patent: 6144933 (2000-11-01), Guccione
patent: 6167537 (2000-12-01), Silva et al.
patent: 6218910 (2001-04-01), Miller
patent: 6223092 (2001-04-01), Miyakawa et al.
patent: 6249133 (2001-06-01), Schwindt
patent: 6255602 (2001-07-01), Evans et al.
patent: 6265888 (2001-07-01), Hsu
patent: 6578174 (2003-06-01), Zizzo
patent: 6594799 (2003-07-01), Robertson et al.
patent: 6701474 (2004-03-01), Cooke et al.
patent: 6714828 (2004-03-01), Eldridge et al.
patent: 6748287 (2004-06-01), Hagen et al.
patent: 6851094 (2005-02-01), Robertson et al.
patent: 2001/0016061 (2001-08-01), Shimoda et al.
patent: 2002/0091979 (2002-07-01), Cooke et al.
patent: 2004/0210413 (2004-10-01), Dorough et al.
patent: 0 740 160 (1996-10-01), None
patent: WO 00/33096 (2000-06-01), None
Keutzer et al., System-Level Design: Orthogonalization of Concerns and Platform-Based Design, Dec. 2000, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 19, No. 12, pp. 1523-1543.
Claasen-Vujcic, Tanja, Analysis of a 200/300mm vertical furnace with integrated metrololgy, Apr. 2001, PennWell Publishing, vol. 44, No. 4, p. S6.

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