Automated system, and corresponding method, for determining aver

Details Automated system, and corresponding method, for determining aver Automated system, and corresponding method, for determining aver

1995-05-23

1997-07-29

Boudreau, Leo

Optical: systems and elements

Deflection using a moving element

Using a periodically moving element

364483, H04B 1008, G01R 1900

Patent

active

056526687

ABSTRACT:
An automated, computer-controlled system automatically measures various parameters associated with the transmitter and/or receiver of an electro-optic module. Measured transmitter parameters include transmitter average power, transmitter rise/fall time, transmitter extinction ratio, transmitter duty cycle distortion, and transmitter data dependent jitter. Measured receiver parameters include receiver sensitivity, receiver pulse width distortion, receiver signal detect threshold, and receiver signal detect assert/deassert times.

REFERENCES:
patent: 4921347 (1990-05-01), Wong et al.
patent: 5396357 (1995-03-01), Goossen et al.
"Growing Industry Addresses Specialized Test Requirements", Evaluation Engineering, vol. 25, No. 6, Jun. 1986, pp. 97-101.

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