Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Patent
1996-07-10
1999-01-26
Dang, Hung Xuan
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
351246, 351200, A61B 300
Patent
active
058643818
ABSTRACT:
Methods and apparatuses for pupil remapping employing non-standard lenslet shapes in arrays; divergence of lenslet focal spots from on-axis arrangements; use of lenslet arrays to resize two-dimensional inputs to the array; and use of lenslet arrays to map an aperture shape to a different detector shape. Applications include wavefront sensing, astronomical applications, optical interconnects, keylocks, and other binary optics and diffractive optics applications.
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Neal, D.R., et al., "A Multi-Tiered Wavefront Sensor Using Binary Optics," Adaptive Optics in Astronomy, pp. 574-585 (Mar. 17, 1994).
Neal, D., et al., "One Dimensional Wavefront Sensor Development for Tomographic Flow Measurements," Soc. Of Photo-Optical Instr. Eng., pp. 378-390 (Jul. 10, 1995).
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Mansell Justin
Neal Daniel R.
Dang Hung Xuan
Libman George H.
Sandia Corporation
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