Automated positioning method for contouring measurements...

Details Automated positioning method for contouring measurements... Automated positioning method for contouring measurements...

2005-07-26

2005-07-26

Lee, Andrew H. (Department: 2877)

Optics: measuring and testing

Dimension

Thickness

C356S614000

Reexamination Certificate

active

06922252

ABSTRACT:
The present invention relates generally to high-temperature vessels lined with refractory material. More specifically, the present invention relates to a method for implementation of tracking and contouring systems, automated collection of data, and processing of the measured data in either a stationary or a mobile configuration to accurately determine profiles of localized refractory thickness and/or bath height of molten material in the high-temperature vessel using the tracking system to fix the position of the contouring system with respect to the vessel.

REFERENCES:
patent: 4893933 (1990-01-01), Neiheisel et al.
patent: 4895440 (1990-01-01), Cain et al.
patent: 5137354 (1992-08-01), deVos et al.
patent: 5212738 (1993-05-01), Chande et al.
patent: 5546176 (1996-08-01), Jokinen
patent: 5570185 (1996-10-01), Jokinen et al.

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