Automated position control of a surface array relative to a...

Details Automated position control of a surface array relative to a... Automated position control of a surface array relative to a...

2007-11-13

2007-11-13

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

11144882

ABSTRACT:
A system and method utilizes an image analysis approach for controlling the probe-to-surface distance of a liquid junction-based surface sampling system for use with mass spectrometric detection. Such an approach enables a hands-free formation of the liquid microjunction used to sample solution composition from the surface and for re-optimization, as necessary, of the microjunction thickness during a surface scan to achieve a fully automated surface sampling system.

REFERENCES:
patent: 5081353 (1992-01-01), Yamada et al.
patent: 5200603 (1993-04-01), Hackenberg et al.
patent: 6803566 (2004-10-01), Van Berkel
patent: 2003/0193020 (2003-10-01), Van Berkel
patent: 2006/0284084 (2006-12-01), Morimoto et al.

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