Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-06-06
2006-06-06
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S106000, C702S124000, C702S189000, C327S077000, C327S094000, C327S095000, C331S00100A, C331S002000, C331S014000, C332S120000, C332S125000, C382S208000
Reexamination Certificate
active
07058528
ABSTRACT:
Disclosed is method of controlling an asymmetric waveform generator including the steps of providing a reference timer signal, and generating an asymmetric waveform as a combination of a first sinusoidal wave having a first frequency and a second sinusoidal wave having a second frequency approximately twice the first frequency. The generated asymmetric waveform is sampled to obtain a set of data points, which set of data points is indicative of the generated asymmetric waveform. The method includes analyzing the set of data points in terms of at least a first function relating to an ideal sinusoidal wave of the first frequency, to determine a first set of resultant values relating to the first sinusoidal wave, and analyzing the set of data points in terms of at least a second function relating to an ideal sinusoidal wave of the second frequency, to determine a second set of resultant values relating to the second sinusoidal wave. In dependence upon the first set of resultant values and the second set of resultant values, a feedback signal for controlling the asymmetric waveform generator is provided.
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Desta Elias
Freedman & Associates
Hoff Marc S.
Ionalytics Corporation
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