Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Patent
1998-06-26
2000-08-15
Hoff, Marc S.
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
702 76, 702 77, 367135, G06F 1900, H04B 106
Patent
active
061049840
ABSTRACT:
In accordance with the present invention, a method for obtaining frequency nformation about a given data set is realized. The method comprises the steps of providing a processing unit; inputting a raw data set into the processing unit; optionally removing at least one trend from the raw data; ordering the raw data; estimating power spectral density using an eigenanalysis approach and the inputted raw data and the ordered raw data; simultaneously estimating the power spectral density using the raw data and a periodogram; generating a time-series representation of the raw data to which curve fitting is applied; comparing the results from the power spectral density estimating steps and the time-series representation generating step to determine if any frequencies suggested by the eigenanalysis approach estimating step are valid; and generating an output signal representative of each valid frequency.
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patent: 4985705 (1991-01-01), Stammler
patent: 5262785 (1993-11-01), Silverstein et al.
patent: 5343404 (1994-08-01), Girgis
patent: 5430690 (1995-07-01), Abel
patent: 5440228 (1995-08-01), Schmidt
Thorpe Steven W.
Whitsitt-Lynch Francis P.
Bui Bryan
Gauthier Robert W.
Hoff Marc S.
Lall Prithvi C.
McGowan Michael J.
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