Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate
2011-08-16
2011-08-16
Rossoshek, Helen (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Physical design processing
C716S102000, C716S104000, C716S105000, C716S117000, C716S124000, C716S126000
Reexamination Certificate
active
08001510
ABSTRACT:
Disclosure is made of approaches for mapping an electronic design specification to an implementation. In one approach, quality metrics are associated with functional units of the design, and the functional units are mapped to respective initial implementations. For each functional unit a respective quality indicator is determined based on the mapping. The quality indicator specifies a degree to which the functional unit achieves the associated quality metric. At least one of the functional units is selected for remapping based on the quality indicator of that functional unit or the quality indicator of another functional unit. An alternative implementation to the initial implementation is selected for each selected functional unit to improve the quality indicator. The selected functional unit is remapped to the selected alternative implementation.
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Janneck Jorn W.
Miller Ian D.
Parlour David B.
Schumacher Paul R.
George Thomas
Maunu LeRoy D.
Rossoshek Helen
Xilinx , Inc.
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