Automated fault diagnosis device and method

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Details

C702S059000, C702S060000, C702S076000

Reexamination Certificate

active

07010445

ABSTRACT:
A diagnostic apparatus and method for sensing a signal emanating from a machine and determining a periodic machine event based on the emanated signal. The apparatus includes analog to digital processing components for digitizing the sensed signal, producing a digitized signal. The apparatus also includes a transform algorithm, memory, an analysis algorithm, and a display. The transform algorithm transforms the digitized signal to generate power spectral density and autocorrelation data which is stored in the memory. The analysis algorithm includes criteria for analyzing the stored power spectral density and autocorrelation data to determine a period machine event based at least in part upon the autocorrelation data. The display displays the periodic machine event to a user. In the event of a suspected defect or fault, the device alerts the user. The user may then elect to proceed with repairs or undertake advanced analysis of the suspected fault as economy dictates.

REFERENCES:
patent: 3654553 (1972-04-01), Mary et al.
patent: 3687517 (1972-08-01), Brun
patent: 3689157 (1972-09-01), Andermo
patent: 3804517 (1974-04-01), Meyr et al.
patent: 3804518 (1974-04-01), Meyr
patent: 3824015 (1974-07-01), Petit et al.
patent: 3885873 (1975-05-01), Andermo
patent: 4031466 (1977-06-01), Krause et al.
patent: 4167330 (1979-09-01), Haville
patent: 4181432 (1980-01-01), Flower
patent: 4204115 (1980-05-01), Boldridge, Jr.
patent: 4312592 (1982-01-01), Sabater et al.
patent: 4329047 (1982-05-01), Kikuchi et al.
patent: 4387785 (1983-06-01), Fromm
patent: 4551018 (1985-11-01), Mannava et al.
patent: 4601580 (1986-07-01), Halliwell
patent: 4638155 (1987-01-01), Dorr
patent: 4774463 (1988-09-01), Mizobuchi et al.
patent: 4866268 (1989-09-01), Tang et al.
patent: 4880966 (1989-11-01), Goodrich et al.
patent: 4968145 (1990-11-01), Takiguchi
patent: 5059901 (1991-10-01), Van Voorhis
patent: 5214278 (1993-05-01), Banda
patent: 5251151 (1993-10-01), Demjanenko et al.
patent: 5365787 (1994-11-01), Hernandez et al.
patent: 5394473 (1995-02-01), Davidson
patent: 5424824 (1995-06-01), Daiber et al.
patent: 5445028 (1995-08-01), Bianchi et al.
patent: 5501226 (1996-03-01), Petersen et al.
patent: 5526109 (1996-06-01), Johnson
patent: 5541732 (1996-07-01), Forin
patent: 5610339 (1997-03-01), Haseley et al.
patent: 5612544 (1997-03-01), Busch
patent: 5636014 (1997-06-01), Hanson
patent: 5646340 (1997-07-01), Gee et al.
patent: 5701172 (1997-12-01), Azzazy
patent: 5872628 (1999-02-01), Erskine
patent: 5974380 (1999-10-01), Smyth et al.
patent: 6208944 (2001-03-01), Franke et al.
patent: 6215408 (2001-04-01), Leonard et al.
patent: 6233045 (2001-05-01), Suni et al.
patent: 6289735 (2001-09-01), Dister et al.
patent: 6542739 (2003-04-01), Garner
patent: 2001/0055320 (2001-12-01), Pierzga et al.
patent: 199 07454 (2000-08-01), None
patent: 2022521 (1990-01-01), None

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