Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
Patent
1998-06-30
2000-09-05
Hoff, Marc S.
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Mechanical measurement system
702190, 702191, 324238, G06F 1900
Patent
active
061156744
ABSTRACT:
A computer implemented information extraction process that locates and identifies eddy current signal features in digital point-ordered signals, signals representing data from inspection of test materials, by enhancing the signal features relative to signal noise, detecting features of the signals, verifying the location of the signal features that can be known in advance, and outputting information about the identity and location of all detected signal features.
REFERENCES:
patent: 5339256 (1994-08-01), Levy et al.
patent: 5424640 (1995-06-01), Levy
patent: 5737445 (1998-04-01), Oppenlander et al.
patent: 5825672 (1998-10-01), Brudnoy
Brudnoy David M.
Levy Arthur J.
Oppenlander Jane E.
Bui Bryan
Gottlieb Paul A.
Hoff Marc S.
Lucas John T.
Moser William R.
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