Automated channel doping measuring circuit

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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324 60R, 324158T, 324158D, G01R 3126, G01R 2726

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active

043250254

ABSTRACT:
An apparatus for measuring the surface potential and impurity concentration in a semi-conductor body by monitoring the current flowing in a semiconductor body when the body is biased with a ramp voltage above its flat band voltage and summing the monitored current with the ramp voltage biasing the body. The apparatus provides direct measurement of surface potential and impurity concentration in a semiconductor structure and is especially useful in metal insulator semiconductor (MIS) structures.

REFERENCES:
patent: 3995216 (1976-11-01), Yun
Ziegler et al., "Determination of . . . ", Solid State Electronics, 1975, vol. 18, pp. 189-198.

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