Automated analysis system for semiconductor manufacturing...

Details Automated analysis system for semiconductor manufacturing... Automated analysis system for semiconductor manufacturing...

2006-06-27

2009-06-16

Nghiem, Michael P. (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Quality evaluation

Reexamination Certificate

active

07548824

ABSTRACT:
A system and method for an automated analysis system for semiconductor manufacturing fabrication is disclosed. The system includes one or more site databases that each store data generated by an associated one or more semiconductor fabrication plants, a configuration database, and a server communicatively coupled to the one or more site databases and the configuration database, the server to analyze the data from the one or more site databases upon a request by a client, the data to be analyzed based on configuration settings in the configuration database that provide uniform configuration synchronization for applying algorithms to the data.

REFERENCES:
patent: 6832227 (2004-12-01), Seki et al.
patent: 6850854 (2005-02-01), Naya et al.
patent: 7185192 (2007-02-01), Kahn
patent: 2003/0140132 (2003-07-01), Champagne et al.
patent: 2005/0216662 (2005-09-01), Sunderland et al.
patent: 2006/0009942 (2006-01-01), Keck et al.
patent: 2007/0168461 (2007-07-01), Moore
patent: 2008/0301666 (2008-12-01), Gordon et al.

Affiliated with

Also associated with

Rating

Automated analysis system for semiconductor manufacturing... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Automated analysis system for semiconductor manufacturing..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Automated analysis system for semiconductor manufacturing... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4138721