Automated analysis of datacenter layout using temperature...

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position

Reexamination Certificate

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Details

C702S130000, C702S127000, C374S141000

Reexamination Certificate

active

07933739

ABSTRACT:
Systems, methods, and software for analyzing the layout of computer equipment racks in a datacenter. One embodiment involves obtaining the position relative to the computer room of each of a plurality of temperature sensors distributed among a plurality of computer components mounted between opposing intake and exhaust ends of each computer equipment rack. The layout of the computer equipment racks is automatically determined from the positions of the temperature sensors, and a representation of the layout of the computer equipment racks is electronically stored or displayed. The actual layout is compared to target layout parameters to score the layout.

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patent: 2005/0286220 (2005-12-01), Moore et al.
patent: 62248020 (1987-10-01), None
patent: 04299720 (1992-10-01), None
patent: 2002319082 (2002-10-01), None

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