Autoanalyzer and probe cleaning method

Details Autoanalyzer and probe cleaning method Autoanalyzer and probe cleaning method

2007-01-29

2008-11-18

Raevis, Robert R (Department: 2856)

Measuring and testing

Sampler, sample handling, etc.

Capture device

Reexamination Certificate

active

07451665

ABSTRACT:
A specimen is sequentially sampled by a probe, and at least one of the number of times of cleaning and a cleaning time when cleaning the probe is changed based on at least one of the number of times of sampling of the specimen by the probe and a sampling amount of the specimen.

REFERENCES:
patent: 4971913 (1990-11-01), Manabe et al.
patent: 5289385 (1994-02-01), Grandone
patent: 2004/0175833 (2004-09-01), Tatsumi
patent: 2005/0014274 (2005-01-01), Lee et al.
patent: 2006/0263250 (2006-11-01), Blouin et al.
patent: 43 14 180 (1993-11-01), None
patent: 4-169851 (1992-06-01), None
patent: 2004-251797 (2004-09-01), None
patent: WO 01/65266 (2001-09-01), None
patent: WO 2007/086477 (2007-02-01), None

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