Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-06-21
2005-06-21
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S067000, C702S085000
Reexamination Certificate
active
06909980
ABSTRACT:
Auto-skew alignment of high-speed eye diagrams of a pair of differential signals defines a figure of merit containing time integrals of mathematical functions dependent on magnitudes of the differential signals and related skew, then calculating an optimized skew value that minimizes the figure of merit. Optimally integrals are performed over a random time interval including at least two consecutive bit periods of the differential signals. Calculations include coarse search for optimum skew and fine search using an adaptively decreasing fine skew interval. Data acquisition and control hardware includes paired independent skew circuits and paired sampling circuits coupled to a timebase generator and a processing unit, which performs calculations in accordance with an auto-deskew algorithm. The accuracy of the optimized skew value is limited only by hardware skew resolution which in present implementations is less than or equal to one picosecond.
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Agilent Technologie,s Inc.
Barlow John
Cherry Stephen J.
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