Optics: measuring and testing – Of light reflection
Reexamination Certificate
2011-05-24
2011-05-24
Stafira, Michael P (Department: 2886)
Optics: measuring and testing
Of light reflection
C356S499000, C356S521000
Reexamination Certificate
active
07948630
ABSTRACT:
Provided is a method for focusing a workpiece in the Z-axis for optical metrology. The auto focusing subsystem includes a focus detector having a tilt angle, a capture range, and a plurality of sensors. A processor coupled to the focus detector is configured to utilize the plurality of focus signals measured using the focus detector to determine two or more focus parameters. The two or more focus parameters and calibration data are used to determine an initial position of the workpiece and to generate instructions to move the workpiece to a best focus position.
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Adam Norton
Tian Xinkang
Cook Jonathon D
Madriaga Manuel B.
Stafira Michael P
Tokyo Electron Limited
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