Auto-deep scan for capacitive sensing

Details Auto-deep scan for capacitive sensing Auto-deep scan for capacitive sensing

2006-12-12

2006-12-12

Hirshfeld, Andrew H. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S686000, C324S067000

Reexamination Certificate

active

07148703

ABSTRACT:
A stud or joist sensor and associated sensing method using an amplitude and a ratio of capacitance measurements from a plurality of capacitive sensing elements. The sensor locates a feature of an object or discontinuity behind a surface or wall, such as an edge and/or a center of a stud behind the surface, a joist under a floorboard, a gap behind sheetrock, a metal conductor behind a surface or the like. The sensor may be moved over the surface, thereby detecting changes in capacitance. The change in capacitance is due to the effective dielectric constant caused by the passage over a hidden object such as a stud. When two capacitive sensing elements provide equivalent capacitance measures, the sensor is over a centerline of the stud. When a ratio of the capacitance measurements equals a transition ratio, the sensor is over an edge of the stud. When the sensor is over the stud and the capacitance measurements are low, the sensor is over a deep stud.

REFERENCES:
patent: 3278843 (1966-10-01), Deming
patent: 3662258 (1972-05-01), Murphy et al.
patent: 3704413 (1972-11-01), Blevins
patent: 3836848 (1974-09-01), Blevins
patent: 3893025 (1975-07-01), Humphreys, Jr.
patent: 4041382 (1977-08-01), Washburn
patent: 4067225 (1978-01-01), Dorman et al.
patent: 4086528 (1978-04-01), Walton
patent: 4099118 (1978-07-01), Franklin et al.
patent: 4130796 (1978-12-01), Shum
patent: 4322678 (1982-03-01), Capots et al.
patent: 4464622 (1984-08-01), Franklin
patent: 4639666 (1987-01-01), Strosser et al.
patent: 4676100 (1987-06-01), Eichberger
patent: 4752727 (1988-06-01), Schneider
patent: 4847552 (1989-07-01), Howard
patent: 4853617 (1989-08-01), Douglas et al.
patent: 4868910 (1989-09-01), Maulding
patent: 4939455 (1990-07-01), Tsugawa
patent: 4947116 (1990-08-01), Welcome et al.
patent: 4992741 (1991-02-01), Douglas et al.
patent: 5023494 (1991-06-01), Tsukii et al.
patent: 5283528 (1994-02-01), van Seeters
patent: 5352974 (1994-10-01), Heger
patent: 5425367 (1995-06-01), Shapiro et al.
patent: 5457394 (1995-10-01), McEwan
patent: 5485092 (1996-01-01), Fortin
patent: 5594353 (1997-01-01), Hemphill
patent: 5617031 (1997-04-01), Tuttle
patent: 5619128 (1997-04-01), Heger
patent: 5812057 (1998-09-01), Hepworth et al.
patent: 5917314 (1999-06-01), Heger et al.
patent: 6023159 (2000-02-01), Heger
patent: 6198271 (2001-03-01), Heger et al.
patent: 6211662 (2001-04-01), Bijawat et al.
patent: 6501284 (2002-12-01), Gozzini
patent: 6552677 (2003-04-01), Barnes et al.
patent: 6556935 (2003-04-01), Morimura et al.
patent: 6587093 (2003-07-01), Shaw et al.
patent: 6650126 (2003-11-01), Indihar
patent: 6700391 (2004-03-01), Strack et al.
patent: 6804262 (2004-10-01), Vogel et al.
patent: 6894508 (2005-05-01), Sanoner et al.
patent: 1 341 005 (2003-09-01), None
patent: 1 341 005 (2003-09-01), None
International Search Report mailed on May 30, 2005 for PCT patent application No. PCT/US2005/003348 filed Feb. 4, 2005, 3 pages.
International Search Report mailed on Jun. 8, 2005 for PCT patent application No. PCT/US2005/004586 filed on Feb. 11, 2005, 3 pages.
Wang, B. et al. (May 19-21, 1997). “High-Accuracy Circuits for On-Chip Capacitive Ratio Testing and Sensor Readout,”IEEE Instrumentation and Measurement Technology Conference, Ottawa, Canada(May 19-21, 1997), 2:1169-1172.

Affiliated with

Also associated with

Rating

Auto-deep scan for capacitive sensing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Auto-deep scan for capacitive sensing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Auto-deep scan for capacitive sensing will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3667587