Auto-calibrating metering system and method of use

Details Auto-calibrating metering system and method of use Auto-calibrating metering system and method of use

2011-08-23

2011-08-23

Rogers, David A. (Department: 2856)

Measuring and testing

Instrument proving or calibrating

Gas or liquid analyzer

C073S001010, C422S087000, C422S403000, C422S404000

Reexamination Certificate

active

08001825

ABSTRACT:
Methods of auto-calibrating a meter are disclosed. In one aspect, the method can include determining a set of calibration information applicable to a sensor and storing the calibration information onto a tag element associated with a sensor dispenser. The tag element can be placed into communication with a reader element that is associated with a meter and which is configured to receive the calibration information so as to allow the meter to use the calibration information in a calibration procedure. Various aspects of a system for auto-calibrating a meter are also disclosed.

REFERENCES:
patent: 4088448 (1978-05-01), Lilja et al.
patent: 4142863 (1979-03-01), Covington et al.
patent: 4476149 (1984-10-01), Poppe et al.
patent: 4554064 (1985-11-01), McClintock et al.
patent: 4578716 (1986-03-01), van Rijckevorsel et al.
patent: 4852025 (1989-07-01), Herpichbohm et al.
patent: 5053199 (1991-10-01), Keiser et al.
patent: 5108564 (1992-04-01), Szuminsky et al.
patent: 5171689 (1992-12-01), Kawaguri et al.
patent: 5312590 (1994-05-01), Gunasingham
patent: 5325853 (1994-07-01), Morris et al.
patent: 5366609 (1994-11-01), White et al.
patent: 5395504 (1995-03-01), Saurer et al.
patent: 5399256 (1995-03-01), Bohs et al.
patent: 5505308 (1996-04-01), Eikmeier et al.
patent: 5525297 (1996-06-01), Dinger et al.
patent: 5609823 (1997-03-01), Harttig et al.
patent: 5628890 (1997-05-01), Carter et al.
patent: 5679311 (1997-10-01), Harttig et al.
patent: 5797693 (1998-08-01), Jaeger et al.
patent: 5856195 (1999-01-01), Charlton et al.
patent: 5880829 (1999-03-01), Kauhaniemi et al.
patent: 5904898 (1999-05-01), Markart
patent: 5942102 (1999-08-01), Hodges et al.
patent: 5989917 (1999-11-01), McAleer et al.
patent: 6027689 (2000-02-01), Markart et al.
patent: 6176119 (2001-01-01), Kintzig et al.
patent: 6180063 (2001-01-01), Markart et al.
patent: 6193873 (2001-02-01), Ohara et al.
patent: 6251260 (2001-06-01), Heller et al.
patent: 6284125 (2001-09-01), Hodges et al.
patent: 6299757 (2001-10-01), Feldman et al.
patent: 6378702 (2002-04-01), Kintzig et al.
patent: 6413410 (2002-07-01), Hodges et al.
patent: 6475372 (2002-11-01), Ohara et al.
patent: 6676995 (2004-01-01), Dick et al.
patent: 6689411 (2004-02-01), Dick et al.
patent: 6716577 (2004-04-01), Yu et al.
patent: 6749887 (2004-06-01), Dick et al.
patent: 6780645 (2004-08-01), Hayter et al.
patent: 6827899 (2004-12-01), Maisey et al.
patent: 6830934 (2004-12-01), Harding et al.
patent: 6952950 (2005-10-01), Doe et al.
patent: 6997343 (2006-02-01), May et al.
patent: 7063234 (2006-06-01), Giraud et al.
patent: 7178416 (2007-02-01), Whelan et al.
patent: 7449148 (2008-11-01), Matsumoto et al.
patent: 7582262 (2009-09-01), Funke et al.
patent: 7628292 (2009-12-01), Lancesseur et al.
patent: 2002/0057993 (2002-05-01), Maisey et al.
patent: 2002/0104849 (2002-08-01), Giruad
patent: 2002/0150501 (2002-10-01), Robertson et al.
patent: 2003/0032190 (2003-02-01), Brown et al.
patent: 2003/0089730 (2003-05-01), May et al.
patent: 2003/0116583 (2003-06-01), Pugh
patent: 2003/0175155 (2003-09-01), Charlton
patent: 2003/0185708 (2003-10-01), Otake
patent: 2003/0186446 (2003-10-01), Pugh
patent: 2003/0223906 (2003-12-01), McAllister et al.
patent: 2004/0007585 (2004-01-01), Griffith et al.
patent: 2004/0050717 (2004-03-01), Teodorczyk et al.
patent: 2004/0178216 (2004-09-01), Brickwood et al.
patent: 2005/0118071 (2005-06-01), Sacherer
patent: 2005/0186162 (2005-08-01), Sato
patent: 2005/0240369 (2005-10-01), Diorio et al.
patent: 2005/0240370 (2005-10-01), Diorio et al.
patent: 2005/0281706 (2005-12-01), Funke et al.
patent: 2006/0104861 (2006-05-01), Windus-Smith et al.
patent: 2006/0226985 (2006-10-01), Goodnow et al.
patent: 2007/0034630 (2007-02-01), Lancesseur et al.
patent: 2007/0172388 (2007-07-01), Padmanabhan et al.
patent: 2007/0208308 (2007-09-01), Gibson et al.
patent: 2007/0233395 (2007-10-01), Neel et al.
patent: 2008/0068197 (2008-03-01), Neubauer et al.
patent: 2008/0114228 (2008-05-01), McCluskey et al.
patent: 2008/0164280 (2008-07-01), Kuriger et al.
patent: 2008/0208042 (2008-08-01), Ortenzi et al.
patent: 2009/0159444 (2009-06-01), Ghesquiere et al.
patent: 2009/0178937 (2009-07-01), Taylor
patent: 5487394 (1994-08-01), None
patent: 3103484 (1982-08-01), None
patent: 3708031 (1987-11-01), None
patent: 0290770 (1988-11-01), None
patent: 0400918 (1990-12-01), None
patent: 0609760 (1994-08-01), None
patent: 0735363 (1996-10-01), None
patent: 0-928967 (1999-07-01), None
patent: 1-081490 (2001-03-01), None
patent: 3167464 (1991-07-01), None
patent: 0434306 (1992-11-01), None
patent: 04343065 (1992-11-01), None
patent: 5002007 (1993-01-01), None
patent: 6222874 (1994-08-01), None
patent: 1351627A (1987-11-01), None
patent: 94/19684 (1994-09-01), None
patent: 9429731 (1994-12-01), None
patent: 99/32881 (1999-07-01), None
patent: 99/60391 (1999-11-01), None
patent: 02/26129 (2002-04-01), None
patent: 03/085392 (2003-10-01), None
European Search Report No. EP 03 00 7604 dated May 19, 2003.
Osamu, Niwa, et al. “Electrochemical Behavior of Reversible Redox Species at Interdigitated Array Electrodes with Different Geometries: Consideration of Redox Cycling and Collection Efficiency”, Analytical Chemistry; Mar. 1990, vol. 62, No. 5, pp. 447-452.

Affiliated with

Also associated with

Rating

Auto-calibrating metering system and method of use does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Auto-calibrating metering system and method of use, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Auto-calibrating metering system and method of use will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2622085