Oscillators – With frequency calibration or testing
Reexamination Certificate
2007-11-06
2007-11-06
Mis, David (Department: 2817)
Oscillators
With frequency calibration or testing
C331S057000
Reexamination Certificate
active
11238633
ABSTRACT:
Apparatus, systems, methods, and articles may divide a frequency associated with an output of an oscillator formed in a semiconductor substrate using a programmable fractional-N divider module (PFNDM) coupled to the oscillator. A calibration module may be coupled to the PFNDM to select the division ratio to yield a first clock signal of an estimated frequency. Other embodiments may be described and claimed.
REFERENCES:
patent: 2007/0069827 (2007-03-01), Haiut
“Ring Oscillator”, [online]. [retrieved on Apr. 16, 2007]. Retrieved from the Internet: <URL: http://tams-www.informatik.uni-hamburg.de/applets/hades/webdemos/12-gatedelay/20-ringoscillator/ringoscillator.html>, 2 pgs.
Appel, G., “RF Signal Processing—Fractional n Synthesizers”, [online]. [archived on Jul. 25, 2004]. Retrieved from the Internet: <URL: http://web.archive.org/ web/20040725050920/http://images.rfdesign.com/files/4/1100Appel34.pdf>, (Nov. 2000), 34-50.
Haiut, M., “Temperature Compensated Crystal Oscillator”, U.S. Appl. No. 11/323,822, filed Dec. 29, 2005.
Intel Corporation
Mis David
Schwegman Lundberg & Woessner, P.A.
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