Radiant energy – Electron energy analysis
Patent
1989-04-27
1991-03-26
Berman, Jack I.
Radiant energy
Electron energy analysis
250311, 250396R, 250396ML, H01J 37145
Patent
active
050031724
ABSTRACT:
An objective lens in an electron microscope is adapted to detection of Auger electrons. Using an additional lens field, preferably including the use of a VAIL lens, the electrons to be detected are spiraled to a selection space. Between the lens field and the selection space a preferably displaceable, magnetic diaphragm is arranged for the separation of lens fields.
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Bleeker Arno J.
Kruit Pieter
Venables John A.
Berman Jack I.
Miller Paul R.
Nguyen Kiet T.
U.S. Philips Corporation
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