Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-10-31
2006-10-31
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S677000, C324S678000
Reexamination Certificate
active
07129712
ABSTRACT:
An electrical circuit for determining a capacitance is described. The electrical circuit includes a first device, a rectifying circuit and a feedback circuit. The first device has a first terminal and a second terminal. The first device has a first unknown capacitance and the first terminal may be configured to receive a time-varying voltage signal. The rectifying circuit has an input terminal, an output terminal and a feedback terminal. The input terminal may be coupled to the second terminal and the output terminal may be configured for coupling to an output electrical circuit. The feedback circuit may selectively couple the output terminal to the input terminal using the feedback terminal such that the output terminal and the input terminal are substantially at a common voltage.
REFERENCES:
patent: 4743837 (1988-05-01), Herzog
patent: 5194819 (1993-03-01), Briefer
patent: 5343157 (1994-08-01), Deschamps
patent: 5463388 (1995-10-01), Boie et al.
patent: 6583632 (2003-06-01), Von Basse et al.
patent: 6683462 (2004-01-01), Shimizu
patent: 6987394 (2006-01-01), Drost et al.
patent: 549354 (1993-06-01), None
Drost Robert J.
Ho Ronald
Hopkins R. David
Deb Anjan
Park Vaughan & Fleming LLP
Sun Microsystems Inc.
Zhu John
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