Attenuating phase shift mask blank and photomask

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07029803

ABSTRACT:
The present invention relates to attenuating phase shift mask blanks for use in lithography, a method of fabricating such a mask blank.

REFERENCES:
patent: 5472811 (1995-12-01), Vasudev et al.
patent: 5477058 (1995-12-01), Sato
patent: 5635315 (1997-06-01), Mitsui
patent: 5897977 (1999-04-01), Carcia et al.
patent: 5939225 (1999-08-01), Dove et al.
patent: 5942356 (1999-08-01), Mitsui et al.
patent: 6274280 (2001-08-01), Carcia
patent: 6458495 (2002-10-01), Tsai et al.
patent: 6458496 (2002-10-01), Motonaga et al.
patent: 2002/0122991 (2002-09-01), Shiota et al.
patent: 04068352 (1992-03-01), None
Burn J. Lin, “The Attenuated Phase-Shifting Mask”, Solid State Technology, Jan. issue, pp. 43-47, (1992).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Attenuating phase shift mask blank and photomask does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Attenuating phase shift mask blank and photomask, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Attenuating phase shift mask blank and photomask will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3597623

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.