Attenuated total reflection spectroscopic analysis of...

Optical waveguides – Optical waveguide sensor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

06954560

ABSTRACT:
The present invention relates to method and apparatus for determining concentrations of organic additives in metal plating solutions, based on infrared spectroscopy, and more specifically attenuated total reflection infrared spectroscopy (ATR-IR).

REFERENCES:
patent: 4818710 (1989-04-01), Sutherland et al.
patent: 4829186 (1989-05-01), McLachlan et al.
patent: 4851665 (1989-07-01), Pesavento et al.
patent: 5434411 (1995-07-01), Miyahara et al.
patent: 2003/0127341 (2003-07-01), King et al.
patent: 2004/0040842 (2004-03-01), King et al.
Paul A. Wilks, “Infrared Solves Some Unusual Problems for the Film Industry”, Spectroscopy, Dec. 2002, 116, 17(12).
Volker Thomsen, “Walther Gerlach and the Foundations of Modern Spectrochemical Analysis”, Spectroscopy, Dec. 2002, 117, 17(12).
Said Al Mosheky, et al., “In Situ Real-Time Monitoring of a Fermentation Reaction Using a Fiber-Optic FT-IR Probe”.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Attenuated total reflection spectroscopic analysis of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Attenuated total reflection spectroscopic analysis of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Attenuated total reflection spectroscopic analysis of... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3478599

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.