Attenuated-total-reflection measurement apparatus

Details Attenuated-total-reflection measurement apparatus Attenuated-total-reflection measurement apparatus

2006-01-23

2009-02-17

Toatley, Jr., Gregory J (Department: 2877)

Optics: measuring and testing

Of light reflection

Reexamination Certificate

active

07492460

ABSTRACT:
The present invention provides an attenuated-total-reflection (“ATR”) measurement apparatus that collects light onto a contact surface between a sample and an ATR prism at an incident angle greater than or equal to a critical angle and measures total-reflection light from the contact surface. The attenuated-total-reflection measurement apparatus according to the invention includes: a light-irradiating system for emitting the light which is collected onto the contact surface; a photodetector for detecting the total-reflection light from the contact surface; an aperture for restricting the light which the photodetector detects to only light from a specific measurement site in the contact surface; and a detection-side scanning mirror provided in a light path extending from the ATR prism to the aperture.

REFERENCES:
patent: 3705755 (1972-12-01), Baer
patent: 6141100 (2000-10-01), Burka et al.
patent: 7224460 (2007-05-01), Soga et al.
Japanese Patent Abstract Publication No. 04-348254 published Dec. 3, 1992, Application No. 03-186804, filed Jul. 1, 1991, one page.

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