Attenuated embedded phase shift photomask blanks

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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Reexamination Certificate

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06979518

ABSTRACT:
An attenuating embedded phase shift photomask blank that produces a phase shift of the transmitted light is formed with an optically translucent film made of metal, silicon, nitrogen and oxygen. An etch stop layer is added to improve the etch selectivity of the phase shifting layer. A wide range of optical transmission (0.001% up to 15% at 157 nm) is obtained by this process.

REFERENCES:
patent: 6309780 (2001-10-01), Smith
patent: 6395433 (2002-05-01), Smith
Burn, J. Lin, “The Attenuated Phase-Shifting Mask”, Solid State Technology, Jan. 1992, pp. 43-47.
Liberman, V. et al., “Materials Issues For Optical Components And Photomasks In 157 NM Lithography”, J. Vac. Sci. Technol. B17, Nov./Dec. 1999, pp. 3273-3279.

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