Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
2006-12-26
2010-06-29
Tang, Minh N (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
C324S758010, C324S537000
Reexamination Certificate
active
07746060
ABSTRACT:
An apparatus comprises: an engagement shaft able to engage with a bottom surface of a DSA and held linear movably; an air cylinder supplying a drive force for linearly moving the engagement shaft; and a link mechanism interposed between the air cylinder and the engagement shaft and transmitting the drive force input from the actuator to the engagement shaft, and the link mechanism transmits the drive force input from the air cylinder by rotary motion.
REFERENCES:
patent: 5191282 (1993-03-01), Liken et al.
patent: 5754057 (1998-05-01), Hama et al.
patent: 6313653 (2001-11-01), Takahashi et al.
patent: 7671614 (2010-03-01), Eldridge et al.
patent: 2002/0070741 (2002-06-01), Siew et al.
patent: 2002/0106927 (2002-08-01), Bosy et al.
patent: 2007/0159532 (2007-07-01), Kiyokawa
patent: 2007/0200555 (2007-08-01), Mizushima et al.
patent: 2007/0206967 (2007-09-01), Kikuchi et al.
patent: 2007/0296432 (2007-12-01), Mineo et al.
patent: 2008/0042667 (2008-02-01), Yamashita et al.
patent: 0699913 (1996-03-01), None
patent: 50-26998 (1975-03-01), None
patent: 50-026998 (1975-03-01), None
patent: 1-178690 (1989-07-01), None
patent: 8-264603 (1996-10-01), None
patent: 11-352181 (1999-12-01), None
patent: 11-352181 (1999-12-01), None
patent: 2000-035459 (2000-02-01), None
patent: 440699 (2001-06-01), None
patent: 00/73807 (2000-12-01), None
English language Abstract of TW 440699, Jun. 16, 2001.
English language Abstract and translation of JP 11-352181 A, Dec. 24, 1999.
English language Abstract and translation of JP 2000-035459 A, Feb. 2, 2000.
English language Abstract of JP 8-264603, Oct. 11, 1996.
English language Abstract of JP 1-178690, Jul. 14, 1989.
English language Abstract of JP 11-352181, Dec. 24, 1999.
Doi Atsuyuki
Ito Yoshimasa
Advantest Corporation
Greenblum & Bernstein P.L.C.
Nguyen Trung Q
Tang Minh N
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