Attachable/detachable variable spacing probing tip system

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With probe – prod or terminals

Reexamination Certificate

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Details

C324S072500

Reexamination Certificate

active

06967473

ABSTRACT:
An attachable/detachable variable spacing probing tip system has a housing that receives pivoting probing arms. Each probing arm has a support member and a probing arm portion of a flexible substrate having a conductive trace thereon. One end of each conductive trace is coupled to a probing contact and the other end coupled to an electrical contact pad on a electrical contact pad portion of the flexible substrate. Each of the probing arm portions has a generally S-shaped fold therein extending from the support members to the electrical contact portion of the flexible substrate. The housing includes means for pivoting the probing arms. The rear surface of the housing has a resilient member disposed therein. Latching means in the housing secures the electrical contact pad portion of the flexible substrate to the rear surface of the housing. Opposing attachment arms from a rear surface of the housing.

REFERENCES:
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patent: 5378990 (1995-01-01), Terry
patent: 6191594 (2001-02-01), Nightingale et al.
patent: 6276956 (2001-08-01), Cook
patent: 6400167 (2002-06-01), Gessford et al.
patent: 6404215 (2002-06-01), Nightingale et al.
patent: 6466000 (2002-10-01), Nightingale
patent: 6603297 (2003-08-01), Gessford et al.
patent: 6704670 (2004-03-01), McTigue

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