Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1984-06-04
1987-02-24
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356312, 356315, 364498, G01J 342
Patent
active
046453431
ABSTRACT:
An improved source lamp assembly for use in atomic absorption spectrophotometers is described having encoded structures for identifying the atomic element of the source lamp assembly, as well as to represent lamp operating current. The encoding structures are formed by way of mechanical, optical, or magnetic means. In particular, a mechanical arrangement involves a plurality of projections and recesses, either formed relative to a base structure of the lamp assembly or relative to an attached card-like structure. A card reading device is used to read this card-like structure. These alternative arrangements can be also used relative to optical encoding or magnetic encoding.
REFERENCES:
patent: 3670638 (1972-06-01), Lindsay
patent: 3810200 (1974-05-01), Sakaguchi et al.
patent: 3898501 (1975-08-01), Hosoya et al.
patent: 4024557 (1977-05-01), Aoyama et al.
patent: 4300834 (1981-11-01), Demers et al.
Baird Brochure, Plasma/AFS Atomic Fluorescence Spectrometer, 1981.
Morley Peter
Stockdale Trevor J.
Evans F. L.
Miller Paul R.
U.S. Philips Corporation
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