Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2006-08-15
2006-08-15
Brewster, William M. (Department: 2823)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S771000, C438S785000
Reexamination Certificate
active
07091129
ABSTRACT:
An atomic layer deposition process that reduces defective bonds formed when depositing atomic layers on a substrate or atomic layer when forming an integrated circuit device. As the layers are formed, a substrate or previous layer is exposed to a first reactant. After the substrate or layer has reacted with the first reactant, the substrate or layer is exposed to a second reactant. During or after exposure to the second reactant, electromagnetic radiation is applied to the substrate or layer. The electromagnetic radiation excites any defective bonds that may form in the deposition process to an energy level high enough to cause the elements forming the defective bonds to react with other elements contained in the second reactant. The reaction forms desirable bonds which attach to the substrate or previous layer to form an additional new layer.
REFERENCES:
patent: 4067893 (1978-01-01), Lander
patent: 2003/0031793 (2003-02-01), Chang et al.
patent: 2004/0245113 (2004-12-01), Bokisa et al.
Chau Robert S.
Hareland Scott A.
Metz Matthew V.
Blakely , Sokoloff, Taylor & Zafman LLP
Brewster William M.
Intel Corporation
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