Atomic layer deposition using photo-enhanced bond...

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S771000, C438S785000

Reexamination Certificate

active

07091129

ABSTRACT:
An atomic layer deposition process that reduces defective bonds formed when depositing atomic layers on a substrate or atomic layer when forming an integrated circuit device. As the layers are formed, a substrate or previous layer is exposed to a first reactant. After the substrate or layer has reacted with the first reactant, the substrate or layer is exposed to a second reactant. During or after exposure to the second reactant, electromagnetic radiation is applied to the substrate or layer. The electromagnetic radiation excites any defective bonds that may form in the deposition process to an energy level high enough to cause the elements forming the defective bonds to react with other elements contained in the second reactant. The reaction forms desirable bonds which attach to the substrate or previous layer to form an additional new layer.

REFERENCES:
patent: 4067893 (1978-01-01), Lander
patent: 2003/0031793 (2003-02-01), Chang et al.
patent: 2004/0245113 (2004-12-01), Bokisa et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Atomic layer deposition using photo-enhanced bond... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Atomic layer deposition using photo-enhanced bond..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Atomic layer deposition using photo-enhanced bond... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3606889

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.