Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With decomposition of a precursor
Reexamination Certificate
2007-10-09
2007-10-09
Kunemund, Robert (Department: 1722)
Single-crystal, oriented-crystal, and epitaxy growth processes;
Forming from vapor or gaseous state
With decomposition of a precursor
C117S101000, C117S105000, C117S108000, C117S109000, C118S715000, C118S716000
Reexamination Certificate
active
11170809
ABSTRACT:
An atomic layer deposition method includes positioning a plurality of semiconductor wafers into an atomic layer deposition chamber. Deposition precursor is emitted from individual gas inlets associated with individual of the wafers received within the chamber effective to form a respective monolayer onto said individual wafers received within the chamber. After forming the monolayer, purge gas is emitted from individual gas inlets associated with individual of the wafers received within the chamber. An atomic layer deposition tool includes a subatmospheric load chamber, a subatmospheric transfer chamber and a plurality of atomic layer deposition chambers. Other aspects and implementations are disclosed.
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U.S. Appl. No. 03/30732, filed Sep. 26, 2003, PCT Search Report.
U.S. Appl. No. 03/30732, filed Sep. 26, 2003, PCT IPER.
Doan Trung Tri
Sandhu Gurtej S.
Kunemund Robert
Micro)n Technology, Inc.
Wells St. John P.S.
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