Atomic layer deposition equipment and method

Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With a step of measuring – testing – or sensing

Reexamination Certificate

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Reexamination Certificate

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07540918

ABSTRACT:
An ALD (Atomic Layer Deposition) apparatus includes a chamber with a sample seated in the reaction space, a supply line providing a raw material gas, an exhaust line through which a reaction gas is exhausted, and a mass analyzer for detecting reaction gases generated within the chamber.

REFERENCES:
patent: 7153362 (2006-12-01), Ko et al.
patent: 2003/0200924 (2003-10-01), Ko et al.

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