Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With a step of measuring – testing – or sensing
Reexamination Certificate
2006-12-12
2009-06-02
Geyer, Scott B. (Department: 2812)
Single-crystal, oriented-crystal, and epitaxy growth processes;
Forming from vapor or gaseous state
With a step of measuring, testing, or sensing
Reexamination Certificate
active
07540918
ABSTRACT:
An ALD (Atomic Layer Deposition) apparatus includes a chamber with a sample seated in the reaction space, a supply line providing a raw material gas, an exhaust line through which a reaction gas is exhausted, and a mass analyzer for detecting reaction gases generated within the chamber.
REFERENCES:
patent: 7153362 (2006-12-01), Ko et al.
patent: 2003/0200924 (2003-10-01), Ko et al.
Dongbu Hi-Tek Co., Ltd.
Geyer Scott B.
Sherr & Vaughn, PLLC
Stevenson Andre′ C
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