Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With decomposition of a precursor
Reexamination Certificate
2006-12-26
2006-12-26
Hiteshew, Felisa (Department: 1722)
Single-crystal, oriented-crystal, and epitaxy growth processes;
Forming from vapor or gaseous state
With decomposition of a precursor
C117S089000, C117S093000, C117S105000
Reexamination Certificate
active
07153363
ABSTRACT:
Substrates are charged with a material by introducing the substrates into an evacuated vacuum container and exposing the surface of the substrates to a reactive gas which is adsorbed on the surface. The exposure is then terminated and the reactive gas adsorbed on the surface is allowed to react. The surface with the adsorbed reactive gas is exposed to a low-energy plasma discharge with ion energy E10on the surface of the substrate of 0<E10≦20 eV and an electron energy Eeoof 0 eV<Eeo≦100 eV. The adsorbed reactive gas is allowed to react at least with the cooperation of plasma-generated ions and electrons and wherein the density of the resulting material charging on the substrate surface is controlled to have a predetermined density ranging from isolated atoms, to forming a continuous monolayer.
REFERENCES:
patent: 5916365 (1999-06-01), Sherman
patent: 6835414 (2004-12-01), Ramm
Hiteshew Felisa
Notaro & Michalos P.C.
OC Oerlikon Balzers AG
LandOfFree
Atomic layer deposition does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Atomic layer deposition, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Atomic layer deposition will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3717027