Atomic force microscopy devices, arrangements and systems

Details Atomic force microscopy devices, arrangements and systems Atomic force microscopy devices, arrangements and systems

2009-02-25

2011-12-20

Berman, Jack (Department: 2881)

Scanning-probe techniques or apparatus; applications of scanning

Monitoring the movement or position of the probe responsive...

By optical means

C850S033000, C850S038000

Reexamination Certificate

active

08082593

ABSTRACT:
Various embodiments of the present invention are directed to microscopy cantilevers. Consistent with an example embodiment, aspects of the invention are directed to a cantilever having a body and a force sensor arrangement extending from an end of the body and including a tip near a free end of the force sensor arrangement. The force sensor arrangement exhibits a high temporal response to the tip's interaction with a sample, relative to the response of the cantilever. The force sensor arrangement's response is detected and used to characterize the sample.

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