Atomic force microscope with optional replaceable fluid cell

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

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250306, G01N 2186

Patent

active

RE0344893

ABSTRACT:
An atomic force microscope which is readily useable for researchers for its intended use without extensive lost time for setup and repair. The probe used therein is a cantilevered optical lever which imparts surface information in a gentle and reliable manner by reflecting an incident laser beam. The probe is carried by a replaceable probe-carrying module which is factory set up and merely inserted and fine tuned by the user. The probe-carrying module also includes the provision for forming a fluid cell around the probe. Fluid can be inserted into and/or be circulated through the fluid cell through incorporated tubes in the porbe-carrying module. Electrodes are also provided in the fluid cell for various uses including real-time studies of electro-chemical operations taking place in the fluid cell. The piezoelectric scan tube employed includes a voltage shield to prevent scanning voltages to the tube from affecting data readings. Samples are easily mounted, replaced, and horizontally adjusted using a sample stage which is magnetically attached to the top of the scan tube. Calibration tools are provided to make initial set up and fine tuning of the microscope a simple and straightforward operation requiring little or no technical talent.

REFERENCES:
patent: 4823004 (1989-04-01), Kaiser et al.
Applied Physics Letters, vol. 55, No. 24, Dec. 11, 1989, New York, pp. 2491-2493; S. A. Chalmers et al.; "Determination of Tilted Superlattice Structure by Atomic Force Microscopy".
Applied Physics Letters, vol. 50, No. 24, Jun. 15, 1987, New York, pp. 1742-1744; R. Sonnenfeld et al.; "Semiconductor Topography in Aqueous Environments: Tunneling Microscopy of Chemomechanically Polished (001) GaAs.
Review of Scientific Instruments, vol. 59, No. 6, Jun. 1, 1988, New York, pp. 833-835; M. D. Kirk et al.; "Low-Temperature Force Microscopy".
Applied Physics Letters, vol. 51, No. 7, Aug. 17, 1987, New York, pp. 484-486; O. Marti et al.; "Atomic Force Microscopy of Liquid-Covered Surfaces: Atomic Resolution Image".
Journal of Vacuum Science and Technology: Part A, vol. 6, No. 2, Mar. 1, 1988, New York, pp. 380-382; P. Davidsson et al.; "A New Symmetric Scanning Tunneling Microscope Design".
"Atomic-Resolution Microscopy in Water"; Richard Sonnenfeld et al., Apr. 11, 1986, vol. 232, pp. 211-213.

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