Tool driving or impacting – Impacting devices – With means for rotating tool
Reexamination Certificate
2008-04-12
2011-10-18
Williams, Hezron E (Department: 2856)
Tool driving or impacting
Impacting devices
With means for rotating tool
C116S275000
Reexamination Certificate
active
08037945
ABSTRACT:
An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.
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Fink Samuel D.
Fondeur Fernando F.
Frank Rodney T
Mullinax, LLC J. Bennett
Savannah River Nuclear Solutions, LLC
Williams Hezron E
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