Atomic force microscope with a plurality of cantilevers for reco

Dynamic information storage or retrieval – Specific detail of information handling portion of system – Radiation beam modification of or by storage medium

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369126, 250306, 25044211, G11B 700, G11B 900

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active

052609260

ABSTRACT:
An information processor comprises a plurality of probes disposed so as to face to a recording medium containing an information, and a plurality of elastic members such as cantilevers supporting the respective probes. The processor reads the information by detecting each displacement of the elastic members. For the detection of displacement, the processor has an optical system for radiating a scanning light beam to the elastic members together with an optical system for detecting a reflected light from the elastic members, or alternatively has a means for detecting each displacement individually such as optically integrated optical members or piezoelectric layers provided to the elastic members.

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patent: 5166520 (1992-11-01), Prater et al.
patent: 5187367 (1993-02-01), Miyazaki et al.
Binnig et al., "Atomic Force Microscope," Physical Review Letter, vol. 56, No. 9, p. 930 (1986).
Staufer et al., "Nanometer Scale Structure Fabrication with the Scanning Tunneling Microscope," Applied Physics Letters, vol. 51, No. 4. p. 244 (1987).

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