Atomic force microscope and method for determining...

Details Atomic force microscope and method for determining... Atomic force microscope and method for determining...

2006-03-07

2006-03-07

Raevis, Robert (Department: 2856)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07009414

ABSTRACT:
A method for determining properties of a sample surface using an atomic force microscope includes applying a first voltage between the sample and a probe, moving the probe towards the surface of the sample, and stopping movement of the probe towards the surface of the sample when current in the probe is initially detected. An oscillating magnetic field is applied to the probe such that the probe obtains stable contact with the surface of the sample.

REFERENCES:
patent: 5925818 (1999-07-01), Cleveland et al.
patent: 5929643 (1999-07-01), Sakai et al.
patent: 6552554 (2003-04-01), Prinz et al.

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