Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Patent
1987-01-23
1988-03-01
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
356326, 356307, G01J 342, G01N 2174
Patent
active
047281898
ABSTRACT:
An absorption profile indicative of a relation in atomic absorption spectroscopy between the absorbance of a desired element and time has a constant half-width independent of the concentration of the desired element in a sample, and hence the half-width of absorption profile with respect to the desired element can be previously determined from data which is obtained by the measurement of a standard sample. In an atomic absorption spectrophotometer herein disclosed, the half-width of absorption profile is previously determined in the above-mentioned manner, and the true peak value of an absorption profile obtained by measuring a sample which contains the desired element at a high concentration, is calculated using the time width of this absorption profile at a predetermined absorbance and the previously-determined half-width.
REFERENCES:
patent: 4377342 (1983-03-01), Koizumi et al.
patent: 4449820 (1984-05-01), Koizumi et al.
Hashimoto Masao
Kamitake Seigo
Oishi Konosuke
Uchino Koichi
Yamada Hideo
Evans F. L.
Hitachi, Ltd. Hitachi Instrument Eng.
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