Atomic absorption analyzing apparatus with adjustable carrier ga

Optics: measuring and testing – By dispersed light spectroscopy – With background radiation comparison

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356312, G01N 2174

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active

054346657

ABSTRACT:
A sample disposed in a graphite tube in a furnace is subjected to thermal treatment at successive stages, drying, ashing and atomization and atomic absorption due to an element contained in the sample is measured. Amounts of inert carrier gas supplied to the graphite tube are different for different samples. The carrier gas flow rate at each of the stages is varied so as to reduce influences of background when each of the samples is treated. The carrier gas flow rate is varied, depending on the magnitude of a background signal measured on the basis of light which has passed through the graphite tube.

REFERENCES:
patent: 3811778 (1974-05-01), Hadeishi
patent: 4314764 (1982-02-01), Liddell et al.
patent: 5104220 (1992-04-01), Okumoto et al.
"HGA-500 Graphite Furnace", Perkin-Elmer brochure, Aug. 1978, p. 5.

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