Atmospheric refractivity profiling apparatus and methods

Measuring and testing – Gas analysis – Moisture content or vapor pressure

Reexamination Certificate

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C073S170280, C342S02600R

Reexamination Certificate

active

11041160

ABSTRACT:
Apparatus and methods for characterizing atmospheric refractivity and its evolution in time and space utilizing passive radiation emission measurement devices are disclosed. Based on an instrument such as a passive microwave radiometer, ancillary meteorological measurements and other information and observations, the apparatus and methods provide useful signatures for characterizing atmospheric refractivity. The system can observe to any vector in the sky, giving directional as well as zenithal measurements of the refractivity profile, its spatial and temporal gradients, and the spatial and temporal trending of the profile and its gradients.

REFERENCES:
patent: 4873481 (1989-10-01), Nelson et al.
patent: 5526676 (1996-06-01), Solheim et al.
patent: 5631414 (1997-05-01), Cherny
patent: 5675081 (1997-10-01), Solheim et al.
patent: 5777481 (1998-07-01), Vivekanandan
patent: 6308043 (2001-10-01), Solheim et al.
patent: 6377207 (2002-04-01), Solheim et al.
patent: 7145499 (2006-12-01), Ware et al.

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