Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate
2005-09-13
2005-09-13
Turner, Samuel A. (Department: 2877)
Optics: measuring and testing
By light interference
Spectroscopy
Reexamination Certificate
active
06943889
ABSTRACT:
An athermal interferometric wavelocker is disclosed having a beam splitter combiner and a first arm of a first material having a first refractive index, a first length, and a first coefficient of expansion; and, a second arm of a second material having a second refractive index, a second length, and a second coefficient of expansion. The refractive indices, lengths and coefficients of expansion of the first arm and the second arm are selected to provide a substantially athermal structure operating at ambient temperatures. The first arm and second arm have inner end faces that meet adjacent faces of the beam splitter and combiner. The first and second arms are of a different optical path length such that light launched into the beam splitter and combiner, interferes upon recombining, and is output from a combiner output port to provide a wavelocker signal having a detectable characteristic which varies with wavelength.
REFERENCES:
patent: 4784490 (1988-11-01), Wayne
patent: 5412676 (1995-05-01), Schnier et al.
patent: 6490394 (2002-12-01), Beall et al.
patent: 6507404 (2003-01-01), Nishioki et al.
patent: 6577398 (2003-06-01), Ducellier
patent: 6621580 (2003-09-01), Myatt et al.
patent: 6694066 (2004-02-01), Xie et al.
patent: 6697160 (2004-02-01), Tsuda
patent: 6826343 (2004-11-01), Davis et al.
patent: 401238081 (1989-09-01), None
Allen Dyer Doppelt Milbrath & Gilchrist, P.A.
JDS Uniphase Corporation
Turner Samuel A.
LandOfFree
Athermal interferometric device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Athermal interferometric device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Athermal interferometric device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3399166