Optics: measuring and testing – By light interference – Having partially reflecting plates in series
Reexamination Certificate
2005-06-21
2005-06-21
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
Having partially reflecting plates in series
C359S578000, C359S629000
Reexamination Certificate
active
06909511
ABSTRACT:
An apparatus is described for controlling the optical path length in an optical device, e.g. an interferometer, and more importantly to maintaining the optical path length difference in an interferometer. The apparatus may include an adjustable plate optically coupled with a beamsplitter. The plate may be rotated such that its surface receives light propagated from the beamsplitter at a non-zero incident angle. In one embodiment, temperature sensitivity is addressed by ensuring that the refractive index of the plate is greater than the refractive index of the beamsplitter. In another embodiment, the apparatus includes combination spacers having a component selected in dependence upon a composition, thickness, and orientation of the adjustable plate.
REFERENCES:
patent: 5982488 (1999-11-01), Shirasaki
patent: 6275322 (2001-08-01), Tai
patent: 6452725 (2002-09-01), Sterling et al.
Abraham Christopher John
Cohen Adam D.
Copner Nigel
Lapinski Feliks
Tan Kim L.
Connolly Patrick
JDS Uniphase Corporation
Lacasse Randy W.
Lacasse & Associates LLC
Toatley , Jr. Gregory J.
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