Asymmetry thin-film transistor

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S061000

Reexamination Certificate

active

07449717

ABSTRACT:
An asymmetry thin-film transistor includes a substrate, a semiconductor layer positioned on the substrate, and a gate positioned on the substrate. The semiconductor layer has a channel region, a single lightly doped region and a first heavily doped region positioned at a side of the channel region, and a second heavily doped region positioned at the other side of the channel region. The semiconductor layer has a central line extending through the semiconductor layer and the substrate, the first heavily doped region and the second heavily doped region have equal lengths and are symmetric with respect to the central line of the semiconductor layer, and the gate is asymmetric with respect to the central line of the semiconductor layer. There is no lightly doped region in between the channel region and the second heavily doped region.

REFERENCES:
patent: 6013930 (2000-01-01), Yamazaki et al.
patent: 6753576 (2004-06-01), Sundaresan
patent: 2002/0028544 (2002-03-01), Fujimoto et al.
patent: 2004/0238820 (2004-12-01), Sakama et al.
patent: 6-349856 (1994-12-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Asymmetry thin-film transistor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Asymmetry thin-film transistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Asymmetry thin-film transistor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4041190

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.