Asymmetrical 4-crystal monochromator

Details Asymmetrical 4-crystal monochromator Asymmetrical 4-crystal monochromator

1994-07-18

1996-04-16

Hannaher, Constantine

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 84, 378 70, G21K 700

Patent

active

055090435

ABSTRACT:
An X-ray analysis apparatus comprises a dispersive system of crystals for monochromatizing an incoming beam in a diffractometer or for analyzing an X-ray beam in an X-ray spectrometer. The system of crystals comprises crystals whose crystal lattice planes do not extend parallel to effectively reflective crystal surfaces. As a result, a substantially higher effective radiation intensity can be obtained, for example notably for (220) crystal faces in germanium.

REFERENCES:
patent: 4567605 (1986-01-01), Bartels
patent: 4821301 (1989-04-01), Cocks et al.
patent: 4928294 (1990-05-01), Beard, Jr. et al.
patent: 5287395 (1994-02-01), Khounsary
"Use of Asymmetric Dynamical Diffraction of X-Rays for Multiple-Crystal Arrangements of the (N1+N2) Setting", Kan Nakayama et al, Z. Naturforsch 28A pp. 632-638 1973.
"Materials Science with SR Using X-Ray Imaging Spatial Resolution/Source Size" M. Kuriyama, Nuclear Instruments and Methods in Physics Research A303 (1991) pp. 503-514.
"Design of High Resolution X-Ray Optical System Using Dynamical Diffraction for Synchrotron Radiation" K. Kohra et al, Nuclear Instruments and Methods 152 (1978) pp. 161-166.
"Dynamical X-Ray Diffraction from a Perfect Crystal Under Grazing Incidence Conditions" H. Hashizume et al, Review of Scientific Instruments (60) 1989 No. 7, Part 2B pp. 2373-2375.

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