Associated grouping of embedded cores for manufacturing test

Details Associated grouping of embedded cores for manufacturing test Associated grouping of embedded cores for manufacturing test

2005-04-19

2005-04-19

Pert, Evan (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

06882159

ABSTRACT:
A structure and associated method for associated grouping of an alpha device with a plurality of dependent devices for a manufacturing test. The alpha device comprises at least one electrical characteristic. The plurality of dependent devices each comprise the at least one electrical characteristic. The alpha device and the plurality dependent devices are grouped together within a semiconductor device for an associated manufacturing test.

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