Assessing mark for microlens

Optical: systems and elements – Single channel simultaneously to or from plural channels – By surface composed of lenticular elements

Reexamination Certificate

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Details

C065S378000, C065S380000

Reexamination Certificate

active

07149034

ABSTRACT:
An assessing mark of microlens array fabricated in a scribe line region includes two vertical line patterns arranged substantially in parallel with each other, and a horizontal line pattern connecting the vertical line patterns. The vertical line patterns and horizontal line pattern define an inner index path. When treated by baking process, the two vertical line patterns are fluidized due to heat and partially merge together from the horizontal line pattern of the assessing mark along the inner index path.

REFERENCES:
patent: 6639726 (2003-10-01), Campbell

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