Assembly-level bist using field-programmable gate array

Details Assembly-level bist using field-programmable gate array Assembly-level bist using field-programmable gate array

1997-02-05

1999-03-02

Nguyen, Hoa T.

Excavating

371 225, 371 226, G01R 3128

Patent

active

058780513

ABSTRACT:
An assembly of logic devices intercommunicates, at least in part, by way of a data and address bus, which may not be accessible from outside the assembly. Consequently, the various logic devices, such as memories and other logic functions, cannot be directly tested. The assembly includes a field-programmable gate array (FPGA), which is programmed to perform a particular function during normal operation of the assembly. The FPGA is reconfigured during a test mode of operation into a built-in self-test (BIST) device capable of testing the various logic devices, without requiring significantly more resources on the assembly.

REFERENCES:
patent: 5381348 (1995-01-01), Ernst et al.
patent: 5623501 (1997-04-01), Cooke et al.

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