X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2007-08-01
2011-10-18
Kiknadze, Irakli (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
Reexamination Certificate
active
08041006
ABSTRACT:
One aspect relates to visualizing, imaging, or providing information at least partially through at least some matter of an at least a portion of an individual, based at least in part on Compton scattering to at least partially form scattered X-rays, the Compton scattering occurring primarily in the at least some matter of the at least the portion of the individual, wherein the visualizing, imaging, or providing information is at least partially performed by converting the scattered X-rays into an at least one scintillated viewable and/or visible light that is detectable by a user. Another aspect relates to Compton scattered X-ray based visualizing, imaging, or providing information of an at least some matter of an at least a portion of an at least one individual to allow the at least one individual and/or an untrained assistant to at least partially visualize, image, or provide information into the at least some matter of the at least the portion of the individual based at least partially on Compton scattered X-rays.
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Boyden Edward S.
Foster Glenn B.
Hyde Roderick A.
Ishikawa Muriel Y.
Jung Edward K. Y.
Kiknadze Irakli
The Invention Science Fund I LLC
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