Array with redundant integrated self-testing scan drivers

Details Array with redundant integrated self-testing scan drivers Array with redundant integrated self-testing scan drivers

1995-12-22

1997-08-05

Canney, Vincent P.

Excavating

39518301, G01R 3128

Patent

active

056549709

ABSTRACT:
An array includes redundant integrated scan drivers that can provide signals to each other through scan lines. Each scan driver can be a shift register, each stage of which includes a tri-state inverter to provide its output to one of the scan lines. To transfer signals from one shift register to the other, one shift register provides signals while the outputs of the other shift register are in a floating state. The other shift register receives the signals and can then shift them to its output. The signals can be test signals used to detect defects in the shift registers and in the array. Also, each stage in each shift register is connected to receive signals from the scan line that is driven by the preceding stage. Therefore, if the preceding stage is removed due to a defect, the following stage can receive signals through the scan line from the other shift register and continue to function even though its preceding stage is removed.

REFERENCES:
patent: 5581541 (1996-12-01), Whetsel

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